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1

Tracer diffusion coefficient of oxide ions in LaCoO3 single crystal

Takamasa Ishigaki, Shigeru Yamauchi, Junichiro Mizusaki, Kazuo Fueki, Hifumi Tamura

Journal:

Journal of Solid State Chemistry

Year:

1984

Language:

english

File:

PDF, 577 KB

english, 1984

2

Sputtered neutral mass spectrometry using post-ionization in a microwave plasma

Tohru Ishitani, Noriyuki Sakudo, Hifumi Tamura, Ichiro Kanomata

Journal:

Physics Letters A

Year:

1978

Language:

english

File:

PDF, 322 KB

english, 1978

3

Quantification of micro-area analysis in SIMS

Setsuko Seki, Hifumi Tamura

Journal:

Surface and Interface Analysis

Year:

2010

Language:

english

File:

PDF, 389 KB

english, 2010

4

Quantitative analysis with an ion microanalyzer

Ishitani, Tohru., Tamura, Hifumi., Kondo, Toshio.

Journal:

Analytical Chemistry

Year:

1975

Language:

english

File:

PDF, 329 KB

english, 1975

5

Determination of carbon in steel by secondary negative ion mass spectrometry

Yamaguchi, Naoharu., Suzuki, Kenichi., Sato, Kimitaka., Tamura, Hifumi.

Journal:

Analytical Chemistry

Year:

1979

Language:

english

File:

PDF, 442 KB

english, 1979

6

Practicality of the thermodynamic model for quantitative ion probe microanalysis of low alloy steels

Shimizu, Ryuichi., Ishitani, Tohru., Kondo, Toshio., Tamura, Hifumi.

Journal:

Analytical Chemistry

Year:

1975

Language:

english

File:

PDF, 559 KB

english, 1975

7

Formation of pyrene crystalline thin films assisted by helium ion bombardment

Migita, Masahito, Taniguchi, Yoshio, Ishihara, Heigo, Akagi, Motoo, Ishiba, Tsutomu, Tamura, Hifumi

Journal:

Journal of Applied Physics

Year:

1985

Language:

english

File:

PDF, 595 KB

english, 1985

8

Stable Field Emission of Electrons from Liquid Metal

Hata, Koichi, Ohya, Ryuichi, Nishigaki, Satoshi, Tamura, Hifumi, Noda, Tamotsu

Journal:

Japanese Journal of Applied Physics

Year:

1987

Language:

english

File:

PDF, 462 KB

english, 1987

9

Detection of SiO 2- Ions from SiO 2 -Si Interface by Means of SIMS

Nakamura, Kazumitsu, Hirose, Hiroshi, Shibata, Atsushi, Tamura, Hifumi

Journal:

Japanese Journal of Applied Physics

Year:

1976

Language:

english

File:

PDF, 290 KB

english, 1976

10

Development of Phosphorus Liquid-Metal-Ion Source

Ishitani, Tohru, Umemura, Kaoru, Tamura, Hifumi

Journal:

Japanese Journal of Applied Physics

Year:

1984

File:

PDF, 380 KB

1984

11

Fabrication of Micro-Elements Resistors by Electron Beam

Kimura, Hirokazu, Tamura, Hifumi

Journal:

Japanese Journal of Applied Physics

Year:

1964

File:

PDF, 1.26 MB

1964

12

Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope

Higuchi, Hisayuki, Tamura, Hifumi

Journal:

Japanese Journal of Applied Physics

Year:

1965

File:

PDF, 456 KB

1965

13

A New Secondary Ion Extractor with Pierce Electrode

Tamura, Hifumi, Kondo, Toshio, Doi, Hiroshi

Journal:

Japanese Journal of Applied Physics

Year:

1971

Language:

english

File:

PDF, 130 KB

english, 1971

14

A Lithium Liquid Metal Ion Source with a Sealed-Cone-Type Reservoir

Seki, Setsuko, Tamura, Hifumi, Akiba, Tsuneo, Sumiya, Hiroyuki

Journal:

Japanese Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 366 KB

english, 2001

15

Boron and Phosphorus Jon Emissions from a Cu-P-Pt-B Liquid Metal Ion Source

Umemura, Kaoru, Ishitani, Tohru, Tamura, Hifumi

Journal:

Japanese Journal of Applied Physics

Year:

1986

File:

PDF, 493 KB

1986

16

A Plasma Ion Gun with Pierce Electrode

Tamura, Hifumi, Kimura, Hirokazu

Journal:

Japanese Journal of Applied Physics

Year:

1966

File:

PDF, 147 KB

1966

17

Mass and Energy Analyses of Gallium-Indium Liquid-Metal-Ion Sources

Ishitani, Tohru, Umemura, Kaoru, Tamura, Hifumi

Journal:

Japanese Journal of Applied Physics

Year:

1985

File:

PDF, 508 KB

1985

18

Characterization of Surfaces and Thin Films by Means of an Ion Microprobe Analyzer

Izumi, Eiichi, Ikebe, Yoshinori, Shichi, Hiroyasu, Tamura, Hifumi

Journal:

MRS Proceedings

Year:

1986

Language:

english

File:

PDF, 243 KB

english, 1986

19

Industrial Application of Surface and Interface Analysis. Use of SIMS for Surface and Interface Analysis of Solids.

Journal:

Bulletin of the Japan Institute of Metals

Year:

1991

File:

PDF, 11.90 MB

1991

20

A scanning electron microscope and its application

Journal:

Year:

1967

File:

PDF, 1.66 MB

1967

21

Qualltitatiue Analysis of Low Alloy Steel with an Ion Microanalyzer

KONDO, TOSHIO, TAMURA, HIFUMI, ISHITANI, TOHRU, NAKAMURA, KAZUMITU

Journal:

Journal of the Mass Spectrometry Society of Japan

Year:

1975

File:

PDF, 781 KB

1975

22

A New Analytical Technique for Insulating Materials by Means of an Ion Microanalyzer

NAKAMURA, KAZUMITSU, AOKI, SINGO, NAKAJIMA, YASUO, DOI, HIROSHI, TAMURA, HIFUMI

Journal:

Journal of the Mass Spectrometry Society of Japan

Year:

1972

Language:

english

File:

PDF, 7.05 MB

english, 1972